TY  - BOOK
AU  - Velasco, Benjamin S.
TI  - Electronic components testing simplified
SN  - 971-085-605-7.
U1  - Fil. 621.381 V433e 1994 
PY  - 1994///
CY  - Mandaluyong City
PB  - National Book Store
KW  - 1. Electronics
N1  - Includes bibliographical references and index
ER  -